Reducing false failure rates requires good data and analytics.
- Measure first time rejects; which impacts first pass yield
- Separate true failures from false failures
- Understand the "Pareto Binning Strategy" TM to identify where to focus
- Apply statistical analysis and charting to formulate the nature of failures
- Isolate and analyze pass and fail conditions executed during false failure occurrences
- Isolate whether the contributing cause originates from hardware, software, or some combination
- Bisect the fault tree until root or primary causes are identified, isolated, and confirmed
- Reproduce the failure mode at will
Our test experts draw from a combination of skills in statistics, data analytics, systems theory, circuit analysis, source code analysis, SW debugging, HW troubleshooting, etc. when identifying and addressing root/primary causes for high false failure rates.
